Electrotechnical Institute Division of Electrotechnology
and Materials Science

M. Sklodowskiej-Curie 55/61
50-369 Wroclaw, POLAND

phone (+48) 71 328 30 61
fax. (+48) 71 328 25 51

ielow@iel.wroc.pl

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Tests/services offer

We offer the following tests and services:

TEST DEVICE

METHOD

RESULT

PARAMETERS

CONTACT

Spin-coater G3P-8

Deposition of thin films from the solutions.

Single- and multilayer structures deposited on various substrates.

Possibility of the rotation speed adjustment in range 100 – 10000 RMP. Ability of defining complex procedures such as: 1000 RRPM for 10s and 1500 RPM for 20s.

A. Hreniak

B. Boharewicz

Potentiostat/ galvanostat Autolab PGSTAT204

Cyclic volto- amperometry, HOMO - LUMO  levels determination

Acquisition of the current flowing through the electrolyte in a function of applied voltage.

Potential range: ±10 V, maximum current ±400 mA. Investigated material dissolved in electrolyte or deposited on ITO electrode.

I. Tazbir

Photovoltaic modules test setup

Solar Simulator SS100AAA

The photovoltaic module is expose to the simulated solar radiation in controlled conditions. While the load is changed, the current and voltage are measured. Once the measurement is finished, the set of parameters determining the solar cell is calculated.

The set of parameters determining the solar cell: shortcut current Isc, open circuit voltage Voc, fill factor FF, effectiveness PCE, maximum power and related current, voltage and serial resistance

A class light source (according to E927 and IEC60904-9 standards)

The controlled radiation intensity up to 1000 W/m2. The voltage measurement range: -20 V to 20 V. The current measurement range:
1 µA to 1 A.
Measurement temperature range: 0 °C to 60 °C. Controlled measurement speed and the voltage polarization direction of tested structures. Maximal size of the samples: 100mm x 100mm.

I. Tazbir

B. Boharewicz

The setup for the determination of the proof and the comparative tracking indices of solid insulating materials

FRIBORG

The measurements are performed according to following standards:

PN-EN 60112:2003

PN-EN 60112-2:2003/A1:2010.

The outcome is the class of the material, determining its resistance to a certain test conditions in terms of the tracking current.

The samples minimal dimensions: 50mm x 50mm. Thickness in range 6mm to 20mm.

M. Wałecki

The setup for the evaluation of the resistance to tracking and erosion

 

Tracking index of resistance to tracking and erosion is determined.

The measurements of the resistance to tracking and erosion, using a liquid contaminant and inclined plane specimens are performed according to standard PN-EN 60587.

The outcome is the class of the material, determining the resistance to the tracking current. The material can be be qualified to a certain group, if during 6hours test, the current did not exceed 60mA for time period longer than 2s, while the surface is wetted using the electrolyte, and the specific voltage is applied.

The samples minimal dimensions: 120 mm x 50 mm, thickness in range: 6 mm to 12 mm, at least 5 samples.

M. Wałecki

Mechanical shock resistance (Izod test)

The mechanical shock resistance is determined by the pendulum hit.

The measurements are performed according to following standard:

PN-EN ISO 180:2004.

The outcome is the average value and standard deviation of the energy necessary to break the sample.

The samples are prepared according to standard, as the for various materials, the requirements are specified.

 

M. Wałecki

The setup for the measurements of the resistance, surface and volume resistivity

The measurement is performed using the electrometer, which provides high current sensitivity and resolution. Applying dedicated setup, the resistivity up to 10^16 Ohm can be measured.

The measurements are performed according to following standards:

The measurements are performed according to following standards:

PN-EN ISO 3915

IEC 60093:1980

IEC 60167:1964

PN-EN 60672-2:2002

The outcome of the measurement is the average value and standard deviation (the result is calculated basing on a series of measurements) of the surface and volume resistivity. If requested by the customer, also the de-electrization curve of the sample can be acquired and delivered.

The measurement range:

10^6-10^16 Ohm.

The samples dimensions:

100mm x 100mm x approx. 3mm (thickness).

M. Wałecki

The setup for the loss tangent and dielectric constant

The measurements of the loss tangent and dielectrical constant are performed in range of  15 Hz -300 MHz (according to standards). The Tettex instrument allows to perform the measurements at the frequency of 50 Hz and 2000 V, and Quadtech instrument in frequency range of 12Hz do 200kHz and  voltage range from 5mV to 1,275 V. The measurement principle bases on the determination of the values of serial and parallel components of the equivalent electrical circuits of the capacitor with dielectric material.

The measurements are performed according to following standards:

PN-86/E-04403

IEC 60250:1969

PN-EN 60672-2:2002

The outcome is the average value and standard deviation of the loss tangent and dielectric constant for a certain sample.

The samples preparation:

Diameter: 100mm, thickness 3mm. The silver contacts (approx. 0.3mm in thickness) are deposited on the surface using evaporation in vacuum.

The measurement electrode diameter:

50mm, the voltage electrode diameter: 75mm.

M. Wałecki

Atomic force microscope (AFM) Innova from Bruker

The microscope allows to investigate the surface at the scale from tens of microns to nanometers. The silicon/ silicon nitride scanning probes are utilized in order to do that. Measurement outcome is related to the type of used probe and measurement mode. It is also possible to perform local modification of the surface using the nanoindentation, nanoscratching or local anodic oxidation methods.

The measurement outcome can be (depending on the measurement mode):

- topography map (quantitative 3D imaging),

- roughness parameters and sizes of observed features,

- the map of the non-homogeneity of the viscous-elastic tip-sample interactions,

- the stiffness map,

- the friction map,

- the electrostatic interactions map,

- the magnetic interactions map,

- the surface potentials map (providing the data for estimation of the work function),

- the piezoelectric constant map,

- the temperature and thermal conductivity map,

- force spectroscopy curves allowing to determine the mechanical properties of the surface as well as the tip-sample interactions in quantitative fashion.

The planar scanning range: 0,1mm x 0,1mm vertical scanning range:  0,007mm. Lateral imaging resolution: 0,1nm, vertical imaging resolution: 0.01 nm. Imaging temperature range: 20-60oC.

Samples dimensions: 30mm x 30 mm x 10 mm. It is possible to investigate the particles, but it is necessary to disperse them on the surface.

A. Sikora

M. Moczała

Atomic force microscope DI 3000

The microscope allows to investigate the surface at the scale from tens of microns to nanometers. The silicon/ silicon nitride scanning probes are utilized in order to do that. Measurement outcome is related to the type of used probe and measurement mode.

The measurement outcome can be (depending on the measurement mode):

- topography map (quantitative 3D imaging),

- roughness parameters and sizes of observed features,

- the map of the non-homogeneity of the viscous-elastic tip-sample interactions,

- the friction map,

- the electrostatic interactions map,

- the magnetic interactions map,

- the surface potentials map (providing the data for estimation of the work function),

- force spectroscopy curves allowing to determine the mechanical properties of the surface as well as the tip-sample interactions in quantitative fashion,

The planar scanning range: 0,1mm x 0,1mm vertical scanning range:  0,005mm. Lateral imaging resolution: 0,1nm, vertical imaging resolution: 0.01 nm. Imaging temperature range: 20-60oC.

Samples dimensions: 200mm x 200 mm x 30 mm. It is possible to investigate the particles, but it is necessary to disperse them on the surface.

A. Sikora

M. Moczała

Climatic chamber Feutron

The climatic chamber allows to expose the object under test to the high/low temperature, low/high humid, as well as the specific temperature and humidity changes.

The measurements are performed according to following standards:

PN-EN 60684-2:2001

PN-EN 60068-2-1:2009

PN-EN 60068-2-2:2009

PN-EN 60068-2-14:2009

PN-EN 60068-2-30:2008

PN-EN 60068-2-31:2010

PN-EN 60068-2-33:2002

PN-EN 60068-2-38:2010

PN-EN 60068-2-78:2007

The outcome is the information, which is related to the verification method, is the changes of the certain properties of the object under test.

Temperature range:

 -70 do +90oC

Relative humidity range: 25%-95%

The chamber dimensions: 720mm x 700mm x 950mm.

M. Wałecki A. Sikora

The chamber simulating the sun radiation exposition.

Atlas Ci65

The chamber allows to expose the object under test to the simulated solar radiation emitted by the xenon lamp. The measurements are performed according to following standards:

PN-EN 60068-2-5:2002

PN-EN ISO 4892-2:2009/A1:2009

The outcome is the information, which is related to the verification method, is the changes of the certain properties of the object under test.

Temperature  +40 °C or 55 °C,

Relative humidity 65% ÷ 90%

Xenon lamp power 6500 W

Total surface of exposed samples 7200cm2

Typical dimensions of the samples: 70mm x 140mm x 5mm. In case of non-standard samples, the possibility of the test should be verified.

M. Wałecki A. Sikora

Determination of temperature of deflection under load and Vicat softening temperature

The temperatures being specific in terms of the plastics classification. The measurements are performed according to following standards:

PN-EN ISO 306:2006
ASTM D 1525-09
PN-EN ISO 75-1:2006
PN-EN ISO 75-2:2006
PN-EN ISO 75-3:2005
ASTM D 648-7

Determination of the temperatures specific for certain plastics.

Samples dimensions: 10mm x 14mm x 100 mm

Max. temperature: 290 oC

E.Kolasińska

 

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© Copyright 2006 IEL/OW
Produkcja (2006) Impact Media.