Description of the publication:

Authors:

Andrzej Sikora, Dmitri V. Sokolov, Hans U. Danzebrink

Title:

Scanning probe microscope set–up with interferometric drift compensation

Journal:

Wiley–VCH

Year:

2005

Vol:

---

Pages:

109–118

ISSN/ISBN:

978-3-527-40502-2

DOI:

-----

Link:

http://www.wiley-vch.de/publish/en/books/ISBN3-527-40502-X

Keywords:

---

Abstract:

Scanning probe microscopes are extremely sensitive instruments, which are strongly influenced by external environmental disturbances. The final quality of the picture depends on system stability as well as thermal, mechanical and electrical noise immunity. While one can isolate the SPM very carefully, it is impossible to avoid any, e.g. thermal, drift in the system. We present an interferometric add–on system applied to a scanning probe microscope construction which allows to monitor drifts of the scanning head and reduce its influence on the measurement result.

References:

♦ Dal Savio, C.; Wolff, H.; Dziomba, T.; Fuß, H.A.; Danzebrink, H.U.; A compact sensor–head for simultaneous scanning force and near–field optical microscopy. Precision Engineering 26 (2002), 199–203.
♦ Dziomba, T.; Koenders, L.; Danzebrink, H.U.; Wilkening G.: Lateral & vertical calibration of Scanning Probe Microscopes and their measurement uncertainty. Proceedings of XI. International Colloquium on Surfaces, February 2nd/3rd 2004, Editor: M. Dietzsch, Shaker Verlag, ISBN 3–8322–2419–X, Aachen (2004)
♦ Güthner, P.; Fischer U.Ch.; Dransfeld K.: Scanning near–field acoustic microscope. Appl. Phys. B 48 (1989), 89
♦ Karrai, K. and Grober, R. D. 1995 Piezoelectric tip–sample distance control for near field optical microscopes. Appl. Phys. Lett. 66 1842–4
♦ Tyrrell, J.W.G.; Sokolov, D.V.; Danzebrink, H.U.: Development of a scanning probe microscope compact sensor head featuring a diamond probe mounted on a quartz tuning fork. Meas. Sci. Technol. 14 (2003), 2139 – 2143

Example figure:

The image showing the idea of the reduction of the Z-axis loop reduction.