Description of the publication:


Andrzej Sikora, Teodor P. Gotszalk


The issues of near field interaction detection in developed combined shear force/ emission microscope


Journal of Physics: Conference Series















The shear force microscopy is one of few AFM methods which allow to scan the surface in the non–contact regime. The advantage of this technique is the possibility of investigation soft and fragile samples. The detection of near field interactions is performed by measurement of the oscillation amplitude of the scanning tip, which oscillates laterally to the surface. Although the method is used effectively in various applications (i.e. SNOM), the origin of the phenomena is still discussed and investigated. In this article we describe some particular experiments performed in order to develop the home built shear force microscope which was combined with emission measurement module. We also present the solution, which allows to prevent unwanted behaviour of the PID regulator, when the electrical field is applied to the tip.


♦ Sikora A, Gotszalk T and Szeloch R 2005 Calibration Standards and Methods, ed. G. Wilkening and L. Koenders (Berlin: Wiley–VCH) 144
♦ Sikora A, Gotszalk T and Szeloch R 2007Microelectronic Engineering 84 542
♦ Davy S, Spajer M and Courjon D 1998 Appl. Phys. Lett. 73 2594
♦ Roby M A D and Wetsel Jr G C 1996 Appl. Phys. Lett. 69 3689
♦ Antognozzi M, Humphris A D L and Miles M J 2001 Applied Physics Lett. 78 300
♦ Okajima T and Hirotsu S 1997 Appl. Phys. Lett. 71 545
♦ Hsu K and Gheber L A 1999 Review of Scientific Instruments 70 3609
♦ Smolyaninov I I, Atia W A, Pilevar S and Davis C C 1998 Ultramicroscopy 71 177
♦ Gregor M J, Blome P G, Schofer J and Ulbrich R G 1996 Appl. Phys. Lett. 68 307
♦ Lapshin D A, Kobylkin E E and Letokhov V S 2000 Ultramicroscopy 83 17
♦ Burns A R and Carpic R W 2001 Appl. Phys. Lett. 78 317
♦ Hoppe S, Ctistis G, Paggel J J and Fumagalli P 2005 Ultramicroscopy 102 221
♦ Brunner R, Marti O, and Hollricher O, 1999 Jour. of Appl. Phys. 86, 7100
♦ Okajima T and Hirotsu S 1997 Appl. Phys. Lett. 71 545
♦ Ndobo–Epoy J–P, Lesniewska E and Guicquero J–P 2005 Ultramicroscopy 103 229
♦ James P J, Antognozzi M, Tamayo J, McMaster T J, Newton J M and Miles M J 2001 Langmuir 17 349
♦ Antognozzi M, Binger D R, Humphris A D L, James P J and Miles M J 2001 Ultramicroscopy 86 223
♦ Vaccaro L, Bernal M–P, Marquis–Weible F and Duschl C 2000 Appl. Phys. Lett. 77 3110
♦ Karrai K and Grober R 1994 Appl. Phys. Lett. 66 1842
♦ Gottlich H, Stark R W, Pedarnig J and Heckl W M 2000 Rev.of Sci. Instr. 71 3104
♦ Ruiter A G T, van der Werf K O, Veerman J A, Garcia–Parajo M F, Rensen W H J and van Hulst N F 1998 Ultramicroscopy 71 149
♦ Lei F H, Nicolas J–L, Troyon M, Sockalingum G D, Rubin S and Manfait M 2003 Jour. of Appl. Phys. 93 2236

Example figure:

The influence of the voltage applied to the scanning tip of the shear force microscope on the Z feedback loop.