Description of the publication:

Authors:

Sikora, A., Bednarz, L.

Title:

Utilization of digital processing of the optical scanning field view for tip–sample distance estimation during the approach procedure

Journal:

Acta Physica Polonica A

Year:

2009

Vol:

116

Pages:

99–101

ISSN/ISBN:

05874246

DOI:

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Link:

http://przyrbwn.icm.edu.pl/APP/PDF/116/a116zs26.pdf

Keywords:

Advanced data processing; Digital processing; Process time; Tip–sample distance, Data processing

Abstract:

In this article we present the method of determining the tip–sample distance using advanced data processing of scanning field's optical picture. This feature can reduce both: the approach process time and the risk of damaging the tip or the sample. Experimental results will be also presented.

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Example figure:

The graph showing the determination of the surface – probe distance using optical microscope image analysis.