Description of the publication:

Authors:

Sikora, A., Bednarz, L.

Title:

Direct measurement and control of peak tapping forces in atomic force microscopy for improved height measurements

Journal:

Measurement Science and Technology

Year:

2011

Vol:

22 (9)

Pages:

---

ISSN/ISBN:

09570233

DOI:

10.1088/0957–0233/22/9/094005

Link:

http://iopscience.iop.org/0957-0233/22/9/094005

Keywords:

AFM; atomic force microscopy; dynamic mode; height measurement; peak force feedback; time–resolved tapping mode; torsional oscillations

Abstract:

The intermittent contact mode, also known as tapping mode, is the most popular AFM measurement technique due to limited force acting on the observed surface and the scanning tip. The tip–sample interaction detection method suffers, however, from the complexity of the forces causing the amplitude and phase change when the tip approaches the surface. In this paper we present the utilization of the time–resolved tip–sample interaction detection technique allowing imaging of the mechanical properties of the sample under the reduced influence of the force applied to the surface on its imaging. Observation of certain phenomena related to the tip–sample contact event, the so–called peak force value, allows us to notice the presence of the feature's height measurement error. Moreover, when the setpoint is changed, the distribution of the peak force map also varies, indicating the altered response of the material to the pressure caused by the tip. Eventually, when the roughness of the surface is calculated, it may vary as well. In this paper, we also propose the utilization of measurement of the maximum force the tip has on the surface during every oscillation cycle as the Z–axis feedback signal in order to improve the measurement technique and reduce the described issue. The experimental data are presented as well.

References:

♦ Anczykowski, B., Krueger, D., Fuchs, H., Cantilever dynamics in quasinoncontact force microscopy: Spectroscopic aspects (1996) Phys. Rev., 53 (23), pp. 15485–15488
♦ San Paulo, A., García, R., Unifying theory of tapping–mode atomic force microscopy (2002) Phys. Rev., 66 (4), p. 041406
♦ Schab–Balcerzak, E., Iwan, A., Krompiec, M., Siwy, M., Tapa, D., Sikora, A., Palewicz, M., New thermotropic azomethine–naphthalene diimides for optoelectronic applications (2010) Synth. Met., 160 (19–20), pp. 2208–2218
♦ Grandbois, M., Clausen–Schaumann, H., Gaub, H., Atomic force microscope imaging of phospholipid bilayer degradation by phospholipase A 2 (1998) Biophysical Journal, 74 (5), pp. 2398–2404
♦ Su, C., Huang, L., Kjoller, K., Babcock, K., Studies of tip wear processes in tapping mode atomic force microscopy (2003) Ultramicroscopy, 97 (1–4), pp. 135–144., DOI 10.1016/S0304–3991(03)00038–X
♦ Khurshudov, A.G., Kato, K., Koide, H., Wear of the AFM diamond tip sliding against silicon (1997) Wear, 203–204, pp. 22–27
♦ Rabe, U., Janser, K., Arnold, W., Vibrations of free and surface–coupled atomic force microscope cantilevers: Theory and experiment (1996) Review of Scientific Instruments, 67 (9), pp. 3281–3293
♦ Garcia, R., San Paulo, A., Attractive and repulsive tip–sample interaction regimes in tapping–mode atomic force microscopy (1999) Phys. Rev., 60 (7), pp. 4961–4967
♦ Garcia, R., Perez, R., Dynamic atomic force microscopy methods (2002) Surface Science Reports, 47 (6–8), pp. 197–301., PII S0167572902000778
♦ San Paulo, A., Garcia, R., Tip–surface forces, amplitude and energy dissipation in amplitude modulation (tapping mode) force microscopy (2001) Phys. Rev., 64 (19), p. 193411
♦ Anczykowski, B., Gotsmann, B., Fuchs, H., Cleveland, J.P., Elings, V.B., How to measure energy dissipation in dynamic mode atomic force microscopy (1999) Applied Surface Science, 140 (3–4), pp. 376–382., PII S0169433298005583
♦ Stark, M., Stark, R.W., Heckl, W.M., Guckenberger, R., Inverting dynamic force microscopy: From signals to time–resolved interaction forces (2002) Proceedings of the National Academy of Sciences of the United States of America, 99 (13), pp. 8473–8478., DOI 10.1073/pnas.122040599
♦ Legleiter, J., Park, M., Cusick, B., Kowalewski, T., Scanning probe acceleration microscopy (SPAM) in fluids: Mapping mechanical properties of surfaces at the nanoscale (2006) Proc. Natl Acad. Sci. USA, 103 (13), pp. 4813–4818
♦ Stark, R.W., Bistability, higher harmonics, and chaos in AFM (2010) Mater. Today, 13 (9), pp. 24–32
♦ Solares, S.D., Holscher, H., Numerical analysis of dynamic force spectroscopy using the torsional harmonic cantilever (2010) Nanotechnology, 21 (7), p. 075702
♦ Solares, S.D., Holscher, H., Numerical analysis of dynamic force spectroscopy using a dual–oscillator sensor (2010) J. Vac. Sci. Technol., 28 (3), pp. 4E1
♦ Legleiter, J., The effect of drive frequency and set point amplitude on tapping forces in atomic force microscopy: Simulation and experiment (2009) Nanotechnology, 20 (24), p. 245703
♦ Husale, S., Persson, H.J., Sahin, O., DNA nanomechanics allows direct digital detection of complementary DNA and microRNA targets (2009) Nature, 462 (7276), pp. 1075–1078
♦ Qu, M., Deng, F., Kalkhoran, S.M., Gouldstone, A., Robisson, A., Van Vliet, K.J., Nanoscale visualization and multiscale mechanical implications of bound rubber interphases in rubber–carbon black nanocomposites (2011) Soft Matter, 7 (3), pp. 1066–1070
♦ Parlak, Z., Hadizadeh, R., Balantekin, M., Degertekin, F.L., Controlling tip–sample interaction forces during a single tap for improved topography and mechanical property imaging of soft materials by AFM (2009) Ultramicroscopy, 109 (9), pp. 1121–1125
♦ Sikora, A., Bednarz, L., Mapping of mechanical properties of the surface by utilization of torsional oscillation of the cantilever in atomic force microscopy (2011) Central Eur. J. Phys., 9 (2), pp. 372–379
♦ Balantekin, M., Atalar, A., Enhanced higher–harmonic imaging in tapping–mode atomic force microscopy (2005) Appl. Phys. Lett., 87 (24), p. 243513
♦ Sahin, O., Quate, C.F., Solgaard, O., Atalar, A., Resonant harmonic response in tapping–mode atomic force microscopy (2004) Phys. Rev., 69 (16), p. 165416
♦ Sahin, O., Magonov, S., Su, C., Quate, C.F., Solgaard, O., An atomic force microscope tip designed to measure time–varying nanomechanical forces (2007) Nature Nanotechnology, 2 (8), pp. 507–514., DOI 10.1038/nnano.2007.226, PII NNANO2007226
♦ Sarioglu, A.F., Solgaard, O., Cantilevers with integrated sensor for time–resolved force measurement in tapping–mode atomic force microscopy (2008) Appl. Phys. Lett., 93 (2), p. 023114
♦ Sahin, O., Erina, N., High resolution and large dynamic range nanomechanical mapping in tapping–mode atomic force microscopy (2008) Nanotechnology, 19 (44), p. 445717

Example figure:

Reconstructed force-distance curves acquired with NanoSwing mode. The indentation non-homogeneity for various materials, causing the surface imaging issues is presented.

Used methods:

NanoSwing