Description of the publication:


Andrzej Sikora, £ukasz Bednarz


Utilization of AFM mapping of surface's mechanical properties in diagnostics of the materials for electrotechnics


Proceedings of Electrotechnical Institute















Atomic force microscopy (AFM) is one of the most powerful diagnostic methods used in micro– and nanoscale imaging of the topography and various physical properties of the surface. As this method involves the scanning tip/sample interaction, it is possible to observe the response of the surface on periodically changing load causing by the scanning tip. By utilizing so called time–resolved tapping mode, we could perform the mapping of the surface’s mechanical properties: stiffness, adhesion, energy dissipation and others. In this paper we present the idea of the NanoSwing imaging technique developed in Electrotechnical Institute, Division of Electrotechnology and Materials Science in Wroc³aw as well as the examples of the measurement results.


♦ Giessibl F.J., AFM's path to atomic resolution, Materials Today, 2005, 8(5), 32–41
♦ Morita S. (Ed.) Roadmap of Scanning Probe Microscopy, Springer, Berlin, 2006
♦ Binnig G., Quate C.F., Gerber C.H., Atomic Force Microscope, Physical Reviev Letters, 1986, 56 (9), 930–933
♦ Meyer G., Amer N. M., Simultaneous measurement of lateral and normal forces with an optical–beam–deflection atomic force microscope, Appl. Phys. Lett., 1990, 57, 2089
♦ Maivald P., Butt H.J., Gould S.A.C., Prater C.B., Drake B., Gurley J.A., Elings V.B., Hansma P.K., Using Force Modulation to Image Surface Elasticities with the Atomic Force Microscope, Nanotechnology 1991, 2:103
♦ Reynaud C., Sommer F., Quet C., El Bounia N., Duc T.M., Quantitative determination of Young''s modulus on a biphase polymer system using atomic force microscopy, Surf. Interface Anal. 2000, 30, 185-189
♦ de Pablo, P. J.; Colchero, J.; Gomez–Herrero, J.; Baro, A. M., Jumping mode scanning force microscopy, Applied Physics Letters 1998, 73 (22), 3300-3302
♦ Gigler A., Gnahm C., Marti O., Schimmel T., Walheim S., Towards quantitative materials characterization with Digital Pulsed Force Mode imaging, Journal of Physics: Conference Series 2000, 61 346-351
♦ Sikora A., Bednarz L. Mapping of mechanical properties of the surface by utilization of torsional oscillation of the cantilever in atomic force microscopy, Central European Journal of Physics, 2011, 9 (2), 372–379
♦ Garcia R., Perez R., Dynamic atomic force microscopy methods., Surf. Sci. Rep. 2002, 47:197–301
♦ Garcia R., San Palo A. Attractive and repulsive tip–sample interaction regimes in tapping–mode atomic force microscopy. Physical Review B, 1999, 60:4961–4967
♦ San Palo A,, Garcia R., Tip–surface forces, amplitude and energy dissipation in amplitude modulation (tapping mode) force microscopy. Physical Review B, 2001, 64:193411
♦ Sahin O., Su C., Magonov S., Quate C.F., Solgaard O., An atomic force microscope tip designed to measure time varying nanomechanical forces, Nature Nanotechnology, 2007, 2:507–514
♦ Sahin O., Harmonic Force Microscope: A new tool for biomolecular identification and characterization based on nanomechanical measurements, Ph.D. dissertation, Stanford University 2005
♦ Bhushan B. (Ed.) Springer Handbook of Nanotechnology. Springer–Verlag Berlin Heidelberg 2010
♦ Mullin N., Vasilev C., Tucker J.D., Hunter C.N., Weber C.H.M., Hobbs J.K., "Torsional tapping" atomic force microscopy using T–shaped cantilevers, Appl. Phys. Lett., 2009, 94, 173109
♦ Derjaguin B.V., Muller V.M., Toporov Y.U.P., Effect of contact deformations on the adhesion of particles, J. Colloid Interface Sci., 1975, 53, 314-326
♦ Schön P., Dutta S., Shirazi M., Noordermeer J., Vancso G.J., Quantitative mapping of surface elastic moduli in silica–reinforced rubbers and rubber blends across the length scales by AFM, J. Mater. Sci., 2011, 46, 3507-3516
♦ Qu M., Deng F., Kalkhoran S.M., Gouldstone A., Robisson A., Van Vliet K.J., Nanoscale visualization and multiscale mechanical implications of bound rubber interphases in rubber–carbon black nanocomposites, Soft Matter., 2011, 7:1066–1070
♦ Husale S., Persson H.J., Sahin O., DNA nanomechanics allows direct digital detection of complementary DNA and microRNA targets. Nature, 2009, 462:1075–U1138
♦ Leung K.M., Wanger G., Guo Q., Gorby Y., Southam G., Lau W.M., Yang J., Bacterial nanowires: conductive as silicon, soft as polymer, Soft Matter, 2011, 7, 6617–6621

Example figure:

Combined 3D topography and energy dissipation image of the polyazomethine sample