Description of the publication:


Sikora, A., Woszczyna, M., Friedemann, M., Ahlers, F.J., Kalbac, M.


AFM diagnostics of graphene–based quantum Hall devices






43 (2–3)









Atomic force microscopy; Graphene; Kelvin probe force microscopy; Mechanical properties mapping; Quantum Hall effect devices


In this paper we present the results of morphological, mechanical and electrical investigation of the properties of prepared graphene flakes and graphene–based quantum Hall devices. AFM imaging allowed us to identify the local imperfections and unintentional modifications of the graphene sheets which had caused severe deterioration of the device electrical performance. Utilizing the NanoSwing imaging method, based on the time–resolved tapping mode, we could observe non–homogeneities of the structural and mechanical properties. We also diagnosed the device under working conditions by Kelvin probe microscopy and detected its local electric field distribution.


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Example figure:

Combined 3D topography and surface potential image of the graphene-based electronic structure.

Used methods:

Surface Potential Imaging (Kelvin Probe Microscopy)