Description of the publication:

Authors:

Ozimek, M., Sikora, A., Wilczyński, W.

Title:

The study of magnetic domain development in shielding films using MFM technique

Journal:

Przegląd Elektrotechniczny

Year:

2013

Vol:

89 (8)

Pages:

208–210

ISSN/ISBN:

00332097

DOI:

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Link:

http://pe.org.pl/abstract_pl.php?nid=7848

Keywords:

Magnetic domain; Magnetic force microscopy; Magnetron sputtering; Shielding thin films

Abstract:

In the article we've described results of the research aimed on recognition magnetic domain structures of thin magnetic film that can be used as a shield. By correlating magnetic domain structures with macroscopic properties of the film, we can implement a new approach, where the large group of small samples is used to select limited group of large samples in order to perform final tests and select the solution suitable for mass production.

References:

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Example figure:

Combined 3D topography and MFM image of the surface of the thin magnetic film.

Used methods:

TapppingMode
Magnetic Force Microscopy