Description of the publication:


Ozimek, M., Sikora, A., Wilczyński, W.


The study of magnetic domain development in shielding films using MFM technique


Przegląd Elektrotechniczny




89 (8)









Magnetic domain; Magnetic force microscopy; Magnetron sputtering; Shielding thin films


In the article we've described results of the research aimed on recognition magnetic domain structures of thin magnetic film that can be used as a shield. By correlating magnetic domain structures with macroscopic properties of the film, we can implement a new approach, where the large group of small samples is used to select limited group of large samples in order to perform final tests and select the solution suitable for mass production.


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Example figure:

Combined 3D topography and MFM image of the surface of the thin magnetic film.

Used methods:

Magnetic Force Microscopy