Description of the publication:

Authors:

S. S. Kamble, A. Sikora, S. T. Pawar, R.C. Kambale, N. N. Maldar, L. P. Deshmukh

Title:

Morphology reliance of cobalt sulfide thin films: A chemo-thermo-mechanical perception

Journal:

Journal of Alloys and Compounds

Year:

2015

Vol:

631

Pages:

303-314

ISSN/ISBN:

----

DOI:

http://dx.doi.org/10.1016/j.jallcom.2015.01.097

Link:

http://www.sciencedirect.com/science/article/pii/S092583881500170X

Keywords:

Dilute magnetic semiconductor, CoS, XRD, EDAX, Magnetic force microscopy, Optical band gap

Abstract:

We report onto the morphology dependency of CoS thin films by studying the role of mechanical agitation, thermal assistance and deposition duration in an aqueous alkaline bath (pH = 9 ± 0.1). The deposition of CoS thin films was carried out at different mechanical stirring rates, deposition temperatures and times. As-optimized CoS thin film were of polycrystalline nature and exhibited hexagonal crystal structure. Co2+ rich nature (≈85%) of optimistically grown thin film was detected. Complex multifaceted webbed network of as-grown elongated and threaded into each other CoS crystals was observed through a scanning electron microscope. Surface morphology was further studied by means of an atomic force microscopy. Existence of magnetic domains was marked in the magnetic force microscopy. As-grown CoS thin films were having transmission index of 0.5 with a band gap of ≈1.59 eV.

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Example figure:

3D view of the surface of the CoS sample.

Used methods:

TapppingMode
Magnetic Force Microscopy