Description of the publication:


Andrzej Sikora, £ukasz Bednarz


Development of the photostimulated Kelvin Probe Force Microscopy setup. The tool for nanoscale diagnostic of optoelectrical properties of the surface


Przegląd Elektrotechniczny




91 (9)









atomic force microscopy, Kelvin Probe Force Microscopy, optical stimulation, optoelectrical properties


In this paper we describe the development of the photostimulated Kelvin Probe Force Microscopy (ps-KPFM) measurement technique allowing to perform mapping of the electrical response of the material to optical excitation. The general information concerning the principles of the measurement setup and the data acquisition procedures as well as the examples of collected data is shown. In particular, the solution allowing to perform a number of measurements according to specific protocol is here sescribed. The developed system is capable of delivering the information about the electrical properties changes due to the specific light wawelength illumination of LED’s in range from 390 nm to 940 nm as well as for the xenon lamp.


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Example figure:

Used methods:

Kelvin Probe Force Microscopy