Description of the publication:

Authors:

Andrzej Sikora, £ukasz Bednarz

Title:

Development of the photostimulated Kelvin Probe Force Microscopy setup. The tool for nanoscale diagnostic of optoelectrical properties of the surface

Journal:

Przegląd Elektrotechniczny

Year:

2015

Vol:

91 (9)

Pages:

166–169

ISSN/ISBN:

2449-9544

DOI:

10.15199/48.2015.09.43

Link:

http://red.pe.org.pl/articles/2015/9/43.pdf

Keywords:

atomic force microscopy, Kelvin Probe Force Microscopy, optical stimulation, optoelectrical properties

Abstract:

In this paper we describe the development of the photostimulated Kelvin Probe Force Microscopy (ps-KPFM) measurement technique allowing to perform mapping of the electrical response of the material to optical excitation. The general information concerning the principles of the measurement setup and the data acquisition procedures as well as the examples of collected data is shown. In particular, the solution allowing to perform a number of measurements according to specific protocol is here sescribed. The developed system is capable of delivering the information about the electrical properties changes due to the specific light wawelength illumination of LED’s in range from 390 nm to 940 nm as well as for the xenon lamp.

References:

♦ Wickramasinghe H.K., Progress in scanning probe microscopy, Acta Materialia, vol. 48 (1), 347-358, 2000
♦ Morita S., Roadmap of Scanning Probe Microscopy, Springer, 2007
♦ Bhushan B., Springer Handbook of Nanotechnology, Springer, 2010
♦ Henning A., Günzburger G., Jöhr R., Rosenwaks Y., BozicWeber B., Housecroft C.E., Constable E.C., Meyer E., Glatzel T., Kelvin probe force microscopy of nanocrystalline TiO2 photoelectrodes, Beilstein J. Nanotechnol., vol. 4, 418-28, 2013
♦ Martin Y., Abraham D.W., Wickramasinghe H.K., Highresolution capacitance measurement and potentiometry by force microscopy, Applied Physics Letters, vol.52 (13), 1103, 1988
♦ Nonnenmacher M., O’Boyle M.P., Wickramasinghe H.K., Kelvin probe force microscopy, Applied Physics Letters, vol. 58 (25), 2921-2923, 1991
♦ Szymoński M., Goryl M., Krok F., Ko³odziej J.J., Mongeot F.B.D., Metal nanostructures assembled at semiconductor surfaces studied with high resolution scanning probes, Nanotechnology, 18 (4), 044016, 2007
♦ Barisci J.N., Stella R., Spinks G.M., Wallace G.G., Study of the surface potential and photovoltage of conducting polymers using electric force microscopy, Synthetic Metals, vol. 124, 407-414, 2001
♦ Sio A., De Madena T., Huber R., Deschler F., Da Como E., Esposito S., Von.Hauff E., Solvent additives for tuning the photovoltaic properties of polymer – fullerene solar cells, Solar Energy Materials & Solar Cells, vol. 95, 3536-3542, 2011
♦ Avila A., Bhushan B., Electrical Measurement Techniques in Atomic Force Microscopy, Critical Reviews in Solid State and Materials Sciences, vol. 35 (1), 38-51, 2010
♦ Sikora A., Bednarz £., Mapping of mechanical properties of the surface by utilization of torsional oscillation of the cantilever in atomic force microscopy, Central European Journal of Physics, vol. 9(2), 372-379, 2011
♦ Sikora A., The method of minimizing the impact of local residual electrostatic charge on dimensions measurement accuracy in atomic force microscopy (AFM) measurements, Measurement Science and Technology, vol. 22, 094022, 2011
♦ Sikora A., Bednarz £., The accuracy of optically supported fast approach solution for scanning probe microscopy (SPM) measuring devices, Measurement Science and Technology, vol. 22, 094015, 2011
♦ Sikora A., Bednarz £., Direct measurement and control of peak tapping forces in atomic force microscopy for improved height measurements, Measurement Science and Technology, vol. 22, 094005, 2011
♦ Sikora A., Bednarz £., The implementation and the performance analysis of the multi-channel software-based lockin amplifier for the stiffness mapping with atomic force microscope (AFM), Bulletin of the Polish Academy of Sciences: Technical Sciences, vol. 60(1), 83-88, 2012
♦ Sikora A., Bednarz £., Dynamic speed control in atomic force microscopy to improve imaging time and quality, Measurement Science and Technology, vol. 25, 044005, 2014
♦ Iwan A., Sikora A., Hamlova V., Bubnov A., AFM study of advanced composite materials for organic photovoltaic cells with active layer based on P3HT:PCBM and chiral photosensitive liquid crystalline dopan

Example figure:

Used methods:

TapppingMode
Kelvin Probe Force Microscopy