Description of the publication:




Quantitative normal force measurements by means of atomic force microscopy. Towards the accurate and easy spring constant determination


Nanoscience and Nanometrology












Atomic Force Microscopy, Scanning Probe, Spring Constant, Calibration, Normal Force Measurement, Force Spectroscopy


Due to its rapid popularity increase within last three decades, with particular focus on submicrometer quantitative surface’s properties imaging, atomic force microscopy (AFM) is still a subject of development and research in terms of both better understanding and efficient utilization of various measurement techniques. Quantitative and comparable measurements at nanoscale are a significant issue, as both: science and industry desire reliable results, allowing to perform repetitive experiments at any time and location. Therefore a numerous analysis and research projects were carried out to provide metrological approach for those techniques in terms of providing the traceability and the uncertainty estimation. In this paper an overview of various methods and approaches towards quantitative determination of the normal spring constant of the AFM probes is presented.


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Example figure:

View of the surface of the calibration feature. A-central part, where the force should be applied, B-springs, C-frame.

Used methods:

Contact Mode
Force Spectroscopy