Description of the publication:

Authors:

Andrzej Sikora, Teodor P. Gotszalk, Roman F. Szeloch, Jarosław Serafińczuk, Grzegorz Jóźwiak

Title:

Mikroskopia bliskiego pola Shear Force/sił atomowych z interpretacją wyników poddanych transformacie FFT

Journal:

Elektronika

Year:

2008

Vol:

11

Pages:

220–222

ISSN/ISBN:

0033-2089

DOI:

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Link:

http://www.sigma-not.pl/publikacja-39689-mikroskopia-bliskiego-pola-shear-force-si%C5%82-atomowych-z-interpretacja-wynik%C3%B3w-poddanych-transformacie-fft-elektronika-konstrukcje-technologie-zastosowania-2008-11.html

Keywords:

Mikroskopia Shear Force/sił atomowych, mikroskopia bliskiego pola, AFM, analiza powierzchni, transformata Fouriera

Abstract:

The Shear Force microscopy (SHFM) and some preliminary results of the surface measurements are presented. In this technique the tip oscillates laterally to the surface near one of its resonant frequencies and the tip's oscillation amplitude is measured in order to estimate the tip–sample distance. It must be emphasized that the tip maintains the distance of several nanometers from the surface; thereby this method can be classified as non–contact. The home–made instrument was used to perform the experiments. Additionally, the Shear Force technique was combined with surface emission measurement feature, which allowed to create a "map" of electrical surface properties. By performing the FFT transforms of the results, new analysis approach was presented.

Example figure:

Schemat ilustrujący konstrukcję mikroskopu shear force / emisji polowej.