Atomic force microscopy (AFM) allows to investigate the surface properties in micron- and nanometer scale (tens of micrometers down to parts of nanometers - see the chart below). As certain measurement mode is applied, surface parameter can be measured as follows: mechanical, electrical, thermal and magnetic. The list of available measurement modes and the kind of information they can deliver, was placed in table below. Innova AFM allows to investigate the surface with maximum scanfield 100x100um (micrometers). The sample's dimentions can not be larger than 4x4cm, and 2cm thick. We would like to encourage you to read the descriptions and see the examples of obtained results which are shown here.

Comparison of resolutions of different microscopes.
SPM: scanning probe microscope (including AFM)
HM: high-resolution optical microscope
PCM: phase-contrast microscope
(S)TEM: (scanning) transmission electron microscope
SEM: scanning electron microscope
REM: reflection electron microscope
FIM: field ion microscope



Diagram based on: G. Binnig and H. Rohrer, "Scanning tunneling microscopy", Helvetica Physica Acta, 55 (1982), 726-735, at 734. Birkhäuser Verlag Basel.


The nanodiagnostics stand is equipped with atomic force microscope (AFM) Innova from Bruker www.bruker-axs.com (former Veeco)



We offer following measurement modes:

Measuring mode

Surface properties

Details

Contact AFM

topography

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TappingMode (Intermittent Contact AFM)

topography

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Non contact AFM

topography

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Lateral Force Microscopy

tribological properties

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Phase Imaging

material properties/ viscoelasticity

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Force Modulation Microscopy

material properties/ stiffness

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Electrostatic Force Microscopy

electrical properties

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Magnetic Force Microscopy

magnetic properties

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Surace Potential Imaging (Kelvin Probe Microscopy)

electrical properties

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Scanning Tunelling Microscopy

electron's state surface

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Force Spectroscopy (force-distance curve)

material properties

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Nanolitography

creating shapes on the surface

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NanoSwing

mechanical properties

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Scanning Thermal Miscroscopy

thermal properties

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The list of the papers