The description of Contact AFM

In contact AFM, the tip is in perpetual contact with the sample. The tip is attached to the end of a cantilever with a low spring constant, lower than the effective spring constant holding the atoms of most solid samples together.

As the scanner gently traces the tip across the sample (or the sample under the tip), the contact force causes the cantilever to bend and the Z-feedback loop works to maintain a constant cantilever deflection.

 

Examples (click to enlarge)


Surface of the calibration sample. Scan field 10x10um.

Surface of the paint with titanium dioxide particles. Scan field 40x40um.

CCD line detector, eletrical paths and connectors area. Scan field 50x50um.

CCD line detector, eletrical paths and connectors area. Scan field 100x100um.

 
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