The description of MFM - Magnetic Force Microscopy

Magnetic Force Microscopy (MFM) is a secondary imaging mode derived from TappingMode mode that maps magnetic force gradient above the sample surface. This is performed through a patented two-pass technique, LiftMode. LiftMode separately measures topography and another selected property (magnetic force, electric force, etc.) using the topographical information to track the probe tip at a constant height (Lift Height) above the sample surface during the second pass.

The MFM probe tip is coated with a ferromagnetic thin film. While scanning, it is the magnetic field's dependence on tip-sample separation that induces changes in the cantilever's resonance frequency or phase. MFM can be used to image both naturally occurring and deliberately written domain structures in magnetic materials. An image of a hard disk acquired in MFM mode is shown.

 

Examples (click to enlarge)


Topography.

Magnetic domains imaging.
40GB HDD surface. Scan size 5x5um.

Topography.

Magnetic domains imaging.
ZIP surface. Scan size 10x10um.

Topography.

Magnetic domains imaging.
Nanocrystalline anisotropic magnetic material - NdFeB. Scan size 3x3um.

Topography.

Magnetic domains imaging.
FeNi layer deposited on glass substrate using magnetron sputtering. Scan size 8x8um.


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