The description of STM - Scanning Tunneling Microscopy

Scanning Tunneling Microscopy (STM) measures topography of surface electronic states using a tunneling current that is dependent on the separation between the probe tip and a sample surface. STM is typically performed on conductive and semiconductive surfaces. Common applications consist of atomic resolution imaging, electrochemical STM, Scanning Tunneling Spectroscopy (STS), and low current imaging of less conductive samples.

 

Examples (click to enlarge)


The surface of the graphite (HOPG).

previous

AFM menu

next